You have requested Quote for Part Number MR27C256 25 B with NSN 5962-01-349-6973 from Solid State Testing Inc
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Part Number: MR27C256 25 B
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Alternate P/N: MR27C25625B
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Manufacturer: Solid State Testing Inc
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NSN: 5962-01-349-6973
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Item Name : Microcircuit Memory
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CAGE Code: 9N185
Part number MR27C256 25 B is now available in our ready-to-ship inventory. The unique NSN for this part is 5962013496973. This part is Microcircuit Memory manufactured by Solid State Testing Inc. Would you like to receive a quick quote for MR27C256 25 B part? Fill out the form to get started.
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NSN Information for Part Number MR27C256 25 B with NSN 5962-01-349-6973, 5962013496973
NSN | FSC | NIIN | CLS | Hazmat | DEMIL | Cancelled NSN |
---|---|---|---|---|---|---|
5962-01-349-6973 Item Description: Microcircuit Memory | 5962 | 013496973 | 0 | N | B | |
CIIC | HCC | ESD | PMIC | Criticality | ENAC | |
U | B | A | 0 | |||
Part Number | ISC | RNVC | RNCC | HCC | MSDS | SADC |
MR27C256 25 B | 5 | 1 | 5 |
Characteristics Data of NSN 5962-01-349-6973, 5962013496973
MRC | Criteria | Characteristic |
---|---|---|
ADAQ | BODY LENGTH | 0.560 INCHES MAXIMUM |
ADAT | BODY WIDTH | 0.560 INCHES MAXIMUM |
ADAU | BODY HEIGHT | 0.110 INCHES MAXIMUM |
AFGA | OPERATING TEMP RANGE | -55.0 TO 125.0 DEG CELSIUS |
AFJQ | STORAGE TEMP RANGE | -65.0 TO 150.0 DEG CELSIUS |
CBBL | FEATURES PROVIDED | MONOLITHIC AND ELECTROSTATIC SENSITIVE AND ULTRAVIOLET ERASABLE |
CQSJ | INCLOSURE MATERIAL | CERAMIC |
CQWX | OUTPUT LOGIC FORM | COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC |
CQZP | INPUT CIRCUIT PATTERN | 14 INPUT |
CZEQ | TIME RATING PER CHACTERISTIC | 20.00 NANOSECONDS MAXIMUM FALL |
CZER | MEMORY DEVICE TYPE | EPROM |
TTQY | TERMINAL TYPE AND QUANTITY | 32 J-HOOK |
CWSG | TERMINAL SURFACE TREATMENT | SOLDER |
CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC | 5.5 VOLTS MAXIMUM INPUT |
CQSZ | INCLOSURE CONFIGURATION | LEADED CHIP CARRIER |
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